No |
Name of
Student |
Project
Title |
1 |
TAN WUI HONG |
Study of Molding
Compound Formulations for Possible Applications
in Electronic Packaging |
2 |
HAN HUIRONG |
Thermal Processing
on the Material Properties of Epoxy Encapsulant
for Integrated Circuits |
3 |
LIM HUI PING,JOANNA |
Reliability of Cu/Low-k
Dielectric Systems |
4 |
LEE CHIN YANG,
MARCUS |
Reliability Study of
Copper Dual Damascene Interconnects with
Different Cap Layers |
5 |
CHENG MEI HWEI |
Joule-Heating
Effects of Copper Interconnects Under AC
Condition |
6 |
I MADE RIKO |
Development of Test
Methodology for Wafer-Level Reliability
Characterization |
7 |
KOH LI BUAY, MAY |
Failure Analysis of
Semiconductor PN Junction |
8 |
ONG SIEW ENG |
Evaluation of
Adhesion Strength of Bonded Cu-Cu Interfaces |
9 |
FARAH BTE ABD MALIK |
Investigation of Cu-Cu
Bonding in a Cu/Low-k Damascene System Using
Destructive Shear Test |
10 |
KHIK SIN CHAI |
Electroless
Deposition of Ni Nanowires through Anodized Al
Template |
11 |
YANG HUIWEN, LYANNE |
Electrodeposition of
Cu Nanowires through Anodized Al Template |
12 |
CHO JIE YING |
Fabrication of Rare
Earth-Based Nanoparticles |
13 |
CHUA YUEH ANG |
Fabrication of Rare
Earth-Based Nanostructures |