Time Period | Modules Taught |
2009/10 Semester 2 | AMN5121 Yield, Reliability & Failure Analysis of Microsystems, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2009/10 Semester 1 | AMN5120 Fundamentals of Semiconductor Device Physics, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2008/09 Semester 2 | AMN5121 Yield, Reliability & Failure Analysis of Microsystems, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2008/09 Semester 1 | AMN5120 Fundamentals of Semiconductor Device Physics, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2007/08 Semester 2 | AMN5121 Yield, Reliability & Failure Analysis of Microsystems, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2007/08 Semester 1 | AMN5120 Fundamentals of Semiconductor Device Physics, |
MS3002 Advanced Materials Processing, | |
MS3003 Materials Failure | |
2006/07 Semester 2 | MS1002 Physics II, |
MS3002 Microelectronics Materials Processing | |
2006/07 Semester 1 | AMN5120 Fundamentals of Semiconductor Device Physics, |
MS3002 Microelectronics Materials Processing | |
2005/06 Semester 2 | MS1002 Physics II, |
MS3002 Microelectronics Materials Processing | |
2005/06 Semester 1 | AMN5120 Fundamentals of Semiconductor Device Physics, |
MS3002 Microelectronics Materials Processing | |
2004/05 Semester 2 | MS1002 Physics II, |
MS302 Semiconductor Processing Technology | |
2004/05 Semester 1 | MS302 Semiconductor Processing Technology |
2003/04 Semester 2 | MS302 Semiconductor Processing Technology |
2003/04 Semester 1 | MS302 Semiconductor Processing Technology |