Xing ZHOU
School of Electrical and Electronic Engineering
Nanyang Technological University
Nanyang Avenue, Singapore 639798, Republic of Singapore
Fig. 1 (a) Sketch of sample and measurement setup for non-uniform gap illumination. (b) Top view of the MSM transmission line. The probing spots labeled 'A,' 'B,' 'C,' and 'D' correspond schematically to the measurement conditions in [1], [2], [3], and [5], respectively.
Fig. 2 Schematic illustration of the measured electrical signals probed at the spots shown in Fig. 1 (b) ('A2' corresponds to that when the bias polarity is reversed [1].)
Fig. 3 Schematic illustration for the physical mechanism of non-uniform gap illumination. (a) Top view of the sample showing the excitation and probing spots. (b) Surface-field distribution across the gap before and after photoexcitation. (c) Local-field transient at the probing spots.
Fig. 4 Calculated surface-field distribution across the gap sampled at t = 0, 1, 10, and 100 ps.
Fig. 5 Local-field transient probed at the cathode (x = 25 µm), in the center (x = 50 µm), at the edge of the excitation spot (x = 64.4 µm), and at the anode (x = 75 µm).
Fig. 6 Terminal-current and terminal-charge transients (outside
scale) superimposed on the local-field transient Fs (probed
at the anode, x = 75 µm) and its time derivative dFs/dt
(inside scale).